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Unlike AFM, STM topography reflects a surface of equal conductivity, which, in low-conductivity materials, does not necessarily coincide with the sample surface. The current setpoint and bias used in this work, 10 pA and 2.3 V, respectively, were enough to penetrate the insulating PSS-rich surface layer, while maintaining stable imaging of the deeper, more conducting bulk layers. See S. Timpanaro et al. [16] for more details.
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