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Volumn 519, Issue 12, 2011, Pages 4105-4109

Thermal annealing effect on the nanomechanical properties and structure of P3HT:PCBM thin films

(4) Karagiannidis, P G a Kassavetis, S a Pitsalidis, C a Logothetidis, S a

a ARISTOTLE UNIVERSITY OF THESSALONIKI (Greece)

Author keywords

Atomic Force Acoustic Microscopy (AFAM); Atomic Force Spectroscopy; Bulk heterojunction; Nanoindentation; Organic photovoltaics

Indexed keywords

AFM; ANNEALED SAMPLES; ANNEALING TEMPERATURES; ATOMIC FORCE ACOUSTIC MICROSCOPY; ATOMIC FORCE SPECTROSCOPY; BULK HETEROJUNCTION; FORCE-DISTANCE CURVES; FULLERENE DERIVATIVE; GLASS SUBSTRATES; NANO-MECHANICAL BEHAVIORS; NANOMECHANICAL PROPERTY; NANOMECHANICAL RESPONSE; NANOSTRUCTURED POLYMERS; NEEDLE-LIKE; ORGANIC PHOTOVOLTAICS; POLY-3-HEXYLTHIOPHENE; POLYMER CRYSTALLINITY; POLYMER SOLAR CELLS; THERMAL ANNEALING EFFECTS;

ACOUSTIC MICROSCOPES; ACOUSTIC SPECTROSCOPY; ACOUSTIC VARIABLES MEASUREMENT; ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALS; FULLERENES; HETEROJUNCTIONS; NANOINDENTATION; PHASE SEPARATION; PHOTOVOLTAIC EFFECTS; POLYMER FILMS; POLYMERS; SPIN GLASS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

ATOMIC SPECTROSCOPY;

EID: 79953692079 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.01.196 Document Type: Article

Times cited : (57)

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