Measurements of electrical conductivity of a nanometer-scale water meniscus by atomic force microscopy

Proceedings of the IEEE Conference on Nanotechnology

Volumn 2, Issue , 2003, Pages 781-784

  Martin C ^a   Murano, F P ^a   Dagata, J A ^b  

^a INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Atomic force microscopy; Atomic measurements; Conductivity measurement; Current measurement; Electric variables measurement; Force measurement; Geometry; Oxidation; Surface topography; Voltage

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; FORCE MEASUREMENT; GEOMETRY; NANOTECHNOLOGY; OXIDATION; SURFACE TOPOGRAPHY;

AFM NANO OXIDATIONS; ATOMIC MEASUREMENTS; CONDUCTIVITY MEASUREMENTS; ELECTRICAL CONDUCTIVITY; ELECTRICAL CURRENT; NANO-METER SCALE; SIMULTANEOUS ACQUISITION; TIME EVOLUTIONS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 84886093697     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2003.1231030     Document Type: Conference Paper

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