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Volumn 32, Issue 19, 2013, Pages 5333-5342

Covalent immobilization of redox-active Fe(κ2-dppe) (η5-C5Me5)-Based π-Conjugated wires on oxide-free hydrogen-terminated silicon surfaces

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE-TRANSFER RATE; COVALENT IMMOBILIZATION; HYDROGEN-TERMINATED SILICON; HYDROGEN-TERMINATED SILICON SURFACES; REDOX CENTERS; REDOX-ACTIVE; SILICON INTERFACE; SILICON SURFACES;

EID: 84885669891     PISSN: 02767333     EISSN: 15206041     Source Type: Journal    
DOI: 10.1021/om4006017     Document Type: Article
Times cited : (12)

References (95)
  • 29
  • 92
    • 84855185634 scopus 로고    scopus 로고
    • ADF2010.02; SCM, Vrije Universiteit: Amsterdam, The Netherlands
    • ADF2010.02; SCM, Theoretical Chemistry; Vrije Universiteit: Amsterdam, The Netherlands, http://www.scm.com.
    • Theoretical Chemistry


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.