Comparison of D.C. and A.C. electro-analytical methods for measuring diode ideality factors and series resistances of silicon solar cells

Current Applied Physics

Volumn 13, Issue 9, 2013, Pages 2087-2097

  Crain, D J ^a   Rock, S E ^a   Garland, J E ^a   Roy, D ^a  

^a CLARKSON UNIVERSITY   (United States)

Author keywords

Diode ideality factor; Impedance spectroscopy; Series resistance; Silicon solar cell

Indexed keywords

ALTERNATING CURRENT; DIODE IDEALITY FACTORS; ELECTRICAL CHARACTERISTIC; ELECTRICAL MEASUREMENT; ELECTRICAL PARAMETER; IMPEDANCE SPECTROSCOPY; LINEAR SWEEP VOLTAMMETRY; SERIES RESISTANCES;

DIODES; ELECTRIC RESISTANCE; OPEN CIRCUIT VOLTAGE; SILICON; SPECTROSCOPY;

SILICON SOLAR CELLS;

EID: 84885408568     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2013.09.012     Document Type: Article

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