Quantitative characterization of silicon solar cells in the electro-analytical approach: Combined measurements of temperature and voltage dependent electrical parameters

Analytical Methods

Volumn 4, Issue 1, 2012, Pages 106-117

  Crain, D J ^a   Garland, J E ^a   Rock, S E ^a   Roy, D ^a  

^a CLARKSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A.C. IMPEDANCE; BACK SURFACE FIELDS; CELL VOLTAGES; CHARACTERISTIC TEMPERATURE; CHARGE RECOMBINATIONS; ELECTRICAL PARAMETER; IMPEDANCE SPECTROSCOPY; LINEAR SWEEP VOLTAMMETRY; MEASURED PARAMETERS; MEASUREMENT TECHNIQUES; MINORITY CARRIER LIFETIMES; QUANTITATIVE CHARACTERIZATION; SENSITIVE FEATURES; SERIES RESISTANCES; SI SOLAR CELLS; SOLID-LIQUID INTERFACES; SOLID-STATE SYSTEM; SPACE CHARGE REGIONS;

CARRIER LIFETIME; ELECTRIC RESISTANCE; PHASE INTERFACES; SILICON SOLAR CELLS;

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;

EID: 84855608011     PISSN: 17599660     EISSN: 17599679     Source Type: Journal    
DOI: 10.1039/c1ay05455d     Document Type: Article

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