Optimization of microcrystalline silicon thin film solar cell isolation processing parameters using ultraviolet laser

Optics and Laser Technology

Volumn 42, Issue 6, 2010, Pages 945-955

  Kuo, Chung Feng Jeffery ^a   Tu, Hung Min ^a   Liang, Shin Wei ^a   Tsai, Wei Lun ^b  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

AHP; Microcrystalline silicon thin film solar cell; Taguchi method

Indexed keywords

AHP; AHP (ANALYTIC HIERARCHY PROCESS); ALUMINUM THIN FILMS; ANOVA (ANALYSIS OF VARIANCE); BACK CONTACT; CONFIDENCE INTERVAL; CRYSTALLINITIES; EDGE SURFACE; HIERARCHICAL STRUCTURES; HIGH REPRODUCIBILITY; LASER SCRIBING; MAIN EFFECT; MATRIX; MICROCRYSTALLINE SILICON THIN FILMS; MULTI-ATTRIBUTES; OPTIMAL PARAMETER; ORTHOGONAL ARRAY; PROCESSING PARAMETERS; QUALITY CHARACTERISTIC; TAGUCHI; TRANSPARENT CONDUCTIVE FILMS; ULTRAVIOLET LASER; WEIGHT CALCULATION; ZNO;

ALUMINUM; ANALYTIC HIERARCHY PROCESS; CONDUCTIVE MATERIALS; EXPERIMENTS; FILM THICKNESS; HIERARCHICAL SYSTEMS; LASER THEORY; OPTIMIZATION; REGRESSION ANALYSIS; SEMICONDUCTING SILICON COMPOUNDS; SILICON SOLAR CELLS; SOLAR CELLS; TAGUCHI METHODS; THIN FILM DEVICES; THIN FILMS; ULTRAVIOLET LASERS; ZINC OXIDE;

MICROCRYSTALLINE SILICON;

EID: 77049104236     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2010.01.013     Document Type: Article

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