Investigation of thin aluminium films on the rear of monocrystalline silicon solar cells for back surface field formation

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 118-121

  Nast Hartley, O ^a   Russell, R ^a   Heasman, K C ^a   Mason, N B ^a   Bruton, T M ^a  

^a BP Solar ^*  (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELECTRIC VARIABLES MEASUREMENT; HIGH TEMPERATURE OPERATIONS; MICROSCOPIC EXAMINATION; MORPHOLOGY; SHORT CIRCUIT CURRENTS; SILICON WAFERS; SINGLE CRYSTALS; SURFACES; TEXTURES; THICKNESS MEASUREMENT; THIN FILMS;

BACK SURFACE FIELD; LASER GROOVED BURIED GRID SOLAR CELL; THIN ALUMINUM FILMS;

SILICON SOLAR CELLS;

EID: 0036953242     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2002.1190470     Document Type: Article

References (8)

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7. + junctions for BSF Solar cells”, 3rd ECPVSEC, Cannes, Oct. 27-31, 1980, pp. 654-658.
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