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Volumn 4, Issue 2, 2011, Pages 485-498

Electro-analytical characterization of photovoltaic cells by combining voltammetry and impedance spectroscopy: Voltage dependent parameters of a silicon solar cell under controlled illumination and temperature

(5) Garland, J E a Crain, D J a Zheng, J P a Sulyma, C M a Roy, D a

a CLARKSON UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

A.C. IMPEDANCE; ANALYTICAL CHARACTERIZATION; BACK SURFACE FIELDS; CELL RESISTANCE; CRYSTALLINE SI; CURRENT-VOLTAGE PLOTS; DEPLETION LAYER CAPACITANCE; DIODE RESISTANCE; DIRECT DETERMINATION; EXPERIMENTAL DATA; EXPERIMENTAL PLATFORM; IMPEDANCE MEASUREMENT; IMPEDANCE SPECTROSCOPY; INDICATOR PARAMETERS; MAJORITY CARRIERS; MINORITY CARRIER; MODEL SYSTEM; NON-LINEAR LEAST SQUARES; PHOTO-THERMAL; PHOTOVOLTAIC DEVICES; PHOTOVOLTAIC PROCESS; PHOTOVOLTAIC SYSTEMS; QUANTITATIVE CHARACTERIZATION; SERIES RESISTANCES; SOLAR SIMULATOR;

CAPACITANCE; PHOTOVOLTAIC CELLS; PHOTOVOLTAIC EFFECTS; SILICON SOLAR CELLS; SOLAR CELLS; SPECTROSCOPIC ANALYSIS; VOLTAMMETRY;

SOLAR POWER GENERATION;

EXPERIMENTAL STUDY; NONLINEARITY; PERFORMANCE ASSESSMENT; PHOTOVOLTAIC SYSTEM; SILICON; TEMPERATURE EFFECT;

EID: 79851475258 PISSN: 17545692 EISSN: 17545706 Source Type: Journal
DOI: 10.1039/c0ee00307g Document Type: Article

Times cited : (37)

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