Measurement of bulk and rear recombination components and application to solar cells with an Al back layer

Solid-State Electronics

Volumn 49, Issue 1, 2005, Pages 49-55

  Lago Aurrekoetxea, R ^a   Del Canizo C ^b   Tobias I ^b   Luque, A ^b  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

Al drive in; Back surface field; Gettering; Lifetime; Photoconductance decay techniques

Indexed keywords

ALUMINUM; DIFFUSION; DOPING (ADDITIVES); ETCHING; FURNACES; MICROWAVES; PHOTOCONDUCTIVITY; SILICON WAFERS;

AL DRIVE-IN; BACK SURFACE FIELD; GETTERING; LIFETIME; PHOTOCONDUCTANCE DECAY TECHNIQUES;

SOLAR CELLS;

EID: 9544245822     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.06.017     Document Type: Article

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