Electron Microscopy on Thin Films for Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells

Volumn , Issue , 2011, Pages 299-345

  Abou Ras, Daniel ^a   Nichterwitz, Melanie ^a   Romero, Manuel J ^b   Schmidt, Sebastian S ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Backscattered electrons (BSEs); Coincidence site lattice (CSL); Electron backscatter diffraction (EBSD); Scanning electron microscopy (SEM); Thin film solar cells; Transmission electron microscopy (TEM)

Indexed keywords

EID: 84882641271     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527636280.ch12     Document Type: Chapter

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