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Volumn 517, Issue 7, 2009, Pages 2357-2359
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Evaluation of electron beam induced current profiles of Cu(In,Ga)Se2 solar cells with different Ga-contents
a
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Author keywords
Cu(In,Ga)Se2; Diffusion length; EBIC
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Indexed keywords
CADMIUM COMPOUNDS;
CHARGE CARRIERS;
CIVIL AVIATION;
DIFFUSION;
ELECTRIC CURRENTS;
ELECTRON BEAMS;
ELECTRON GUNS;
MONTE CARLO METHODS;
PARTICLE BEAMS;
PHOTOVOLTAIC CELLS;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR JUNCTIONS;
SOLAR CELLS;
SOLAR EQUIPMENT;
SURFACE DIFFUSION;
BACK-CONTACT RECOMBINATIONS;
CARRIER GENERATIONS;
CDS;
CHARGE STATE;
CROSS SECTIONS;
CU(IN,GA)SE2;
DIFFUSION LENGTH;
EBIC;
ELECTRON-BEAM-INDUCED CURRENTS;
ELECTROSTATIC POTENTIALS;
EVALUATION METHODS;
LINE SCANS;
MINORITY CARRIERS;
MONTE CARLO SIMULATIONS;
SPACE CHARGES;
SURFACE RECOMBINATIONS;
COPPER;
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EID: 58949086613
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.11.049 Document Type: Article |
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Times cited : (20)
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References (7)
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