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Volumn 67, Issue , 1999, Pages 57-68

Qualitative and quantitative analysis of thin film heterostructures by Electron Beam Induced Current

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; GRAIN BOUNDARIES; INDUCED CURRENTS; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; QUANTUM EFFICIENCY; SEMICONDUCTING FILMS; SOLAR CELLS; THIN FILM DEVICES;

EID: 0032659779     PISSN: 10120394     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/ssp.67-68.57     Document Type: Article
Times cited : (10)

References (56)
  • 1
    • 0020221895 scopus 로고
    • eds. Johari, O., IIT Research Institute, Chicago
    • J.-F. Bresse, in "Scanning Electron Microscopy", (eds. Johari, O.), IIT Research Institute, Chicago, 1487 (1982).
    • (1982) "Scanning Electron Microscopy" , pp. 1487
    • Bresse, J.-F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.