Correlating the structural, chemical, and optical properties at nanometer resolution

Journal of Applied Physics

Volumn 107, Issue 1, 2010, Pages

  Gu, L ^a   Ozdol V B ^a   Sigle, W ^a   Koch, C T ^a   Srot, V ^a   Van Aken, P A ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; ELECTRON MONOCHROMATORS; FAST ELECTRONS; HIGH SPATIAL RESOLUTION; IMAGING ENERGY FILTERS; NANO-METER SCALE; NANOMETER RESOLUTIONS; RELIABLE MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPE; VALENCE ELECTRON;

ELECTRON MICROSCOPES; ELECTRONIC STRUCTURE; ELECTRONS; IMAGE RESOLUTION; MONOCHROMATORS; OPTICAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 75649097460     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3275048     Document Type: Article

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