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Applied Physics Letters

Volumn 103, Issue 5, 2013, Pages

Graphene-metal contact resistivity on semi-insulating 6H-SiC(0001) measured with Kelvin probe force microscopy

(4) Druga, Thomas a Wenderoth, Martin a Lüpke, Felix a Ulbrich, Rainer G a

a UNIVERSITY OF GÖTTINGEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTIVITIES; FEW-LAYER GRAPHENE; GRAPHENE LAYERS; KELVIN PROBE FORCE MICROSCOPY; MEASUREMENTS OF; RESISTANCE NETWORK; SEMI-INSULATING; TRANSPORT MEASUREMENTS;

COMPUTER SIMULATION; ELECTRODES; GOLD; PROBES; SILICON CARBIDE;

GRAPHENE;

EID: 84882337548 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4816955 Document Type: Article

Times cited : (15)

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