Depth profiling and melting of nanoparticles in secondary ion mass spectrometry (SIMS)

Journal of Physical Chemistry C

Volumn 117, Issue 31, 2013, Pages 16042-16052

  Yang, Li ^a   Seah, Martin P ^a   Gilmore, Ian S ^a   Morris, Richard J H ^b   Dowsett, Mark G ^b   Boarino, Luca ^c   Sparnacci, Katia ^d   Laus, Michele ^d  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^d UNIVERSITY OF EASTERN PIEDMONT   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOPARTICLE; DEPTH-PROFILING ANALYSIS; LAYER REMOVAL; LOW-ENERGY DEPOSITIONS; SCANNING ELECTRON MICROSCOPE; SIMS DEPTH PROFILE; SPUTTERING YIELDS; ULTRA LOW ENERGY;

CESIUM; DEPOSITION; DEPTH PROFILING; IONS; MELTING; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SILVER;

GOLD;

EID: 84881434167     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp4048538     Document Type: Article

References (36)

1. Baer, D. R.; Amonette, J. E.; Engelhard, M. H.; Gaspar, D. J.; Karakoti, A. S.; Kuchibhatla, S.; Nachimuthu, P.; Nurmi, J. T.; Qiang, Y.; Sarathy, V. Characterization Challenges for Nanomaterials Surf. Interface Anal. 2008, 40, 529-537
2. Mohanraj, V. J.; Chen, Y. Nanoparticles-A Review Trop. J. Pharm. Res. 2006, 5, 561-573
3. Grassian, V. H. When Size Really Matters: Size-Dependent Properties and Surface Chemistry of Metal and Metal Oxide Nanoparticles in Gas and Liquid Phase Environments J. Phys. Chem. C 2008, 112, 18303-18313
4. Baer, D. R.; Gaspar, D. J.; Nachimuthu, P.; Techane, S. D.; Castner, D. G. Application of Surface Chemical Analysis Tools for Characterization of Nanoparticles Anal. Bioanal. Chem. 2010, 396, 983-1002
5. Scholes, P. D.; Coombes, A. G. A.; Illum, L.; Davis, S. S.; Watts, J. F.; Ustariz, C.; Vert, M.; Davies, M. C. Detection and Determination of Surface Levels of Poloxamer and PVA Surfactant on Biodegradable Nanospheres using SSIMS and XPS J. Controlled Release 1999, 59, 261-278
6. Rajagopalachary, S.; Verkhoturov, S. V.; Shweikert, E. A. Examination of Nanoparticles Via Single Large Cluster Impacts Nano Lett. 2008, 8, 1076-1080
7. Rajagopalachary, S.; Verkhoturov, S. V.; Shweikert, E. A. Characterization of Individual Ag Nanoparticles and their Chemical Environment Anal. Chem. 2009, 81, 1089-1094
8. Rajagopalachary, S.; Verkhoturov, S. V.; Shweikert, E. A. Examination of Individual Nanoparticles with Cluster SIMS Surf. Interface Anal. 2011, 43, 547-550
9. Techane, S. D.; Gamble, L. J.; Castner, D. G. Multitechnique Characterization of Self-Assembled Carboxylic Acid-Terminated Alkanethiol Monolayers on Nanoparticle and Flat Gold Surfaces J. Phys. Chem. C 2011, 115, 9432-9441
10. Szymczak, W.; Menzel, N.; Kreyling, W. G.; Wittmaack, K. TOF-SIMS Characterisation of Spark-Generated Nanoparticles Made from Pairs of Ir-Ir and Ir-C Electrodes Int. J. Mass Spectrom. 2006, 254, 70-84
11. Fukuhara, N.; Suzuki, K.; Takeda, K.; Nihei, Y. Characterization of Environmental Nanoparticles Appl. Surf. Sci. 2008, 255, 1538-1540
12. Kim, Y. P.; Oh, Y. H.; Moon, D. W.; Lee, T. G.; Kim, H. S. Protein Kinase Assay on Peptide-Conjugated Gold Nanoparticles by Using Secondary-Ion Mass Spectrometric Imaging Angew. Chem., Int. Ed. 2007, 46, 6816-6819
13. Shi, D.; Zhou, Y.; Wang, S. X.; Van Ooij, W. J.; Wang, L. M.; Zhao, J. G. Multi-layer Coating of Ultrathin Polymer Films on Nanoparticles of Alumina by a Plasma Treatment Mater. Res. Soc. Symp. 2001, 635, C4.28.1-C4.28.6
14. Lee, J. L. S.; Ninomiya, S.; Matsuo, J.; Gilmore, I. S.; Seah, M. P.; Shard, A. G. Organic Depth Profiling of a Nanostructured Delta Layer Reference Material using Large Argon Cluster Ions Anal. Chem. 2010, 82, 98-105
15. Yang, L.; Seah, M. P.; Anstis, E. H.; Gilmore, I. S.; Lee, J. L. S. Sputtering Yields of Gold Nanoparticles by C60 Ions J. Phys. Chem. C 2012, 116, 9311-9318
16. Grojo, D.; Boarino, L.; De Leo, N.; Rocci, R.; Panzarasa, G.; Delaporte, P.; Laus, M.; Sparnacci, K. Size Scaling of Mesoporous Silica Membranes Produced by Nanosphere Mediated Laser Ablation Nanotechnology 2012, 23, 485305
17. Ninomiya, S.; Nakata, Y.; Ichiki, K.; Seki, T.; Aoki, T.; Matsuo, J. Measurements of Secondary Ions Emitted from Organic Compounds Bombarded with Large Gas Cluster Ions Nucl. Instrum. Methods Phys. Res., Sect. B 2007, 256, 493-496
18. Kayser, S.; Rading, D.; Moellers, R.; Kollmer, F.; Niehuis, E. Surface Spectrometry Using Large Argon Clusters Surf. Interface Anal. 2013, 45, 131-133
19. Yang, L.; Seah, M. P.; Gilmore, I. S. Sputtering Yields for Gold using Argon Gas Cluster Ion Beams J. Phys. Chem. C 2012, 116, 23735-23741
20. Seah, M. P. Universal Equation for Argon Gas Cluster Sputtering Yields J. Phys. Chem. C 2013, 117, 12622-12632
21. Dowsett, M. G. Depth Profiling using Ultra-Low-Energy Secondary Ion Mass Spectrometry Appl. Surf. Sci. 2003, 203-204, 5-12
22. + SIMS Surf. Interface Anal. 2011, 43, 543-546
23. Seah, M. P. Topography Effects and Monatomic Ion Sputtering of Undulating Surfaces, Particles and Large Nanoparticles: Sputtering Yields, Effective Sputter Rates and Topography Evolution Surf. Interface Anal. 2012, 44, 208-218
24. Rizk, B.; Hunten, D. M.; Engel, S. Effects of Size-Dependent Emissivity on Maximum Temperatures During Micrometeorite Entry J. Geophys. Res. 1991, 96, 1303-1314
25. Kersting, R.; Breitenstein, D.; Hagenhoff, B.; Fartmann, M.; Heller, D.; Grehl, T.; Brüner, P.; Niehuis, E. Surface Characterization of Nanoparticles: Different Surface Analytical Techniques Compared Surf. Interface Anal. 2013, 45, 131-133
26. Stöber, W.; Fink, A.; Bohn, E. Controlled Growth of Monodisperse Silica Spheres in the Micron Size Range J. Colloid Interface Sci. 1968, 26, 62-69
27. Bell, N. C.; Minelli, C.; Tompkins, J.; Stevens, M. M.; Shard, A. G. Emerging Techniques for Submicrometer Particle Sizing Applied to Stöber Silica Langmuir 2012, 28, 10860-10872
28. Bailey, J. R.; McGuire, M. M. ATR-FTIR Observations of Water Structure in Colloidal Silica: Implications for the Hydration Force Mechanism Langmuir 2007, 23, 10995-10999
29. Leite, C. A. P.; de Souza, E. F.; Galambeck, F. Core-and-Shell Nature of Stöber Silica Particles J. Braz. Chem. Soc. 2001, 12, 519-525
30. Hedler, A.; Klaumünzer, S. L.; Wesch, W. Amorphous Silicon Exhibits a Glass Transition Nat. Mater. 2004, 3, 804-809
31. Masalov, V. M.; Sukhinina, N. S.; Kudrenko, E. A.; Emelchenko, G. A. Mechanism of Formation and Nanostructure of Stöber Silica Particles Nanotechnology 2011, 22, 275718
32. Seah, M. P.; Nunney, T. S. Sputtering Yields of Compounds Using Argon J. Phys. D: Appl. Phys. 2010, 43, 253001
33. Wehner, G. K. Influence of the Angle of Incidence on Sputtering Yields J. Appl. Phys. 1959, 30, 1762-1765
34. Seah, M. P.; Clifford, C. A.; Green, F. M.; Gilmore, I. S. An Accurate Semi-Empirical Equation for Sputtering Yields, I: for Argon Ions Surf. Interface Anal. 2005, 37, 444-458
35. Seah, M. P. An Accurate Semi-Empirical Equation for Sputtering Yields, II: for Neon, Argon and Xenon Ions Nucl. Instrum. Methods, B 2005, 229, 348-358
36. Ziegler, J. F. The Stopping and Range of Ions in Matter. SRIM 2006; available free from http://www.srim.org/.