Surface spectrometry using large argon clusters

Surface and Interface Analysis

Volumn 45, Issue 1, 2013, Pages 131-133

  Kayser, S ^a   Rading, D ^a   Moellers, R ^a   Kollmer, F ^a   Niehuis, E ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

90 pulsing system; Ar n+; argon cluster; Bin+ Irganox 1010; fragmentation; mass separation by momentum deflection; polycarbonate; secondary ion yield; surface spectrometry; TOF SIMS

Indexed keywords

ARGON CLUSTERS; FRAGMENTATION; IRGANOX 1010; PULSING SYSTEM; SECONDARY ION YIELD; TOF SIMS;

CLUSTER ANALYSIS; IONS; POLYCARBONATES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

SPECTROMETRY;

EID: 84872853284     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4932     Document Type: Conference Paper

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