Examination of individual nanoparticles with cluster SIMS

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 547-550

  Rajagopalachary, S ^a   Verkhoturov, S V ^a   Schweikert, E A ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

C60; cluster impacts; nanoparticle collisions; nanoparticles; secondary ion emission; ToF SIMS

Indexed keywords

C60; CLUSTER IMPACT; CLUSTER SIMS; MASS SPECTROMETRIC DATA; METALLIC IONS; ORGANIC SUBSTRATE; SAMS; SECONDARY ION EMISSION; SINGLE LAYER; SIZE RANGES; SMALL OBJECTS; TOF SIMS;

GOLD COATINGS; IONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLED MONOLAYERS;

NANOPARTICLES;

EID: 78951473553     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3564     Document Type: Conference Paper

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