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Volumn 102, Issue 15, 2013, Pages

Reduction of 1/f noise in graphene after electron-beam irradiation

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER NUMBER FLUCTUATION; ELECTRON-BEAM IRRADIATIONS; GRAPHENE DEVICES; MICRO RAMAN SPECTROSCOPY; NOISE SPECTRAL DENSITY; RADIO FREQUENCY SYSTEMS; SOURCE-DRAIN CURRENT; STRUCTURAL DISORDERS;

EID: 84877104408     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4802759     Document Type: Article
Times cited : (81)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.