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Journal of Applied Physics

Volumn 106, Issue 2, 2009, Pages

On the Hooge relation in semiconductors and metals

(3) Dmitriev, A P a Levinshtein, M E a Rumyantsev, S L a

a IOFFE INSTITUTE (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; DEFECTS IN SEMICONDUCTORS; LOW-FREQUENCY NOISE; MOBILITY FLUCTUATIONS; NOISE MECHANISMS; RELATIVE CONTRIBUTION; SAMPLE VOLUME; SPECTRAL NOISE DENSITIES; UNIFIED APPROACH;

BIOACTIVITY; CARRIER CONCENTRATION; SPECTRAL DENSITY;

CARRIER MOBILITY;

EID: 68249135356 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3186620 Document Type: Article

Times cited : (34)

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