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Journal of Materials Chemistry C

Volumn 1, Issue 11, 2013, Pages 2112-2120

Copper oxide quantum dot ink for inkjet-driven digitally controlled high mobility field effect transistors

(4) Vaseem, Mohammad a Hong, A Ra a Kim, Ryun Tak a Hahn, Yoon Bong a

a Chonbuk National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITALLY CONTROLLED; EDGE DEFINITION; FIELD EFFECT TRANSISTOR (FETS); HIGH CARRIER MOBILITY; HIGH-MOBILITY FIELD-EFFECT TRANSISTORS; MICROWAVE-ASSISTED; MONOCLINIC PHASE; SOLUTION PROCESS;

ELECTRIC PROPERTIES; FIELD EFFECT TRANSISTORS; SEMICONDUCTOR QUANTUM DOTS;

INK;

EID: 84875847374 PISSN: 20507534 EISSN: 20507526 Source Type: Journal
DOI: 10.1039/c3tc00869j Document Type: Article

Times cited : (47)

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