Activationless charge transport across 4.5 to 22 nm in molecular electronic junctions

Proceedings of the National Academy of Sciences of the United States of America

Volumn 110, Issue 14, 2013, Pages 5326-5330

  Yan, Haijun ^a   Bergren, Adam Johan ^a   McCreery, Richard ^a,b   Della Rocca, Maria Luisa ^c   Martin, Pascal ^d   Lafarge, Philippe ^c   Lacroix, Jean Christophe ^d  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF ALBERTA   (Canada)

^c UNIVERSITÉ PARIS DIDEROT   (France)

^d UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

All carbon molecular junction; Attenuation coefficient; Field ionization; Strong electronic coupling

Indexed keywords

ARTICLE; CHARGE TRANSPORT; ELECTRIC FIELD; ELECTRICITY; HIGH TEMPERATURE; IONIZATION; PRIORITY JOURNAL; SEMICONDUCTOR;

CARBON; ELECTRONICS; HOT TEMPERATURE; ION EXCHANGE; NANOTECHNOLOGY; QUANTUM THEORY; SEMICONDUCTORS;

EID: 84875837617     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1221643110     Document Type: Article

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