Charge transport in molecular electronic junctions: Compression of the molecular tunnel barrier in the strong coupling regime

Proceedings of the National Academy of Sciences of the United States of America

Volumn 109, Issue 29, 2012, Pages 11498-11503

  Sayed, Sayed Y ^a   Fereiro, Jerry A ^a   Yan, Haijun ^b   McCreery, Richard L ^a,b   Bergren, Adam Johan ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Charge transport; Electronic coupling; Energy alignment; Fermi level pinning; Molecular electronics

Indexed keywords

CARBON;

ARTICLE; COMPLEX FORMATION; COMPRESSION; COVALENT BOND; ENERGY; MEMBRANE CONDUCTANCE; MICROELECTRODE; MODULATION; MOLECULAR INTERACTION; MOLECULAR JUNCTION; MOLECULAR STABILITY; PRIORITY JOURNAL;

CARBON; ELECTRIC CONDUCTIVITY; ELECTROCHEMICAL TECHNIQUES; ELECTRODES; HYDROCARBONS, AROMATIC; MODELS, CHEMICAL; PHOTOELECTRON SPECTROSCOPY;

EID: 84863962787     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1201557109     Document Type: Article

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