Transition from tunneling to hopping in single molecular junctions by measuring length and temperature dependence

Journal of the American Chemical Society

Volumn 132, Issue 33, 2010, Pages 11658-11664

  Hines, Thomas ^a   Diez Perez, Ismael ^a   Hihath, Joshua ^a   Liu, Hongmei ^b   Wang, Zhong Sheng ^c   Zhao, Jianwei ^b   Zhou, Gang ^c   Müllen, Klaus ^d   Tao, Nongjian ^d  

^a ARIZONA STATE UNIVERSITY   (United States)

^b NANJING UNIVERSITY   (China)

^c FUDAN UNIVERSITY   (China)

^d MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BREAK JUNCTIONS; CHARGE HOPPING; CHARGE TRANSPORT; COHERENT TUNNELING; CONDUCTION MECHANISM; DIFFERENT MECHANISMS; ELEVATED TEMPERATURE; FOUR-WIRE; MOLECULAR JUNCTION; MOLECULAR WIRES; SCANNING TUNNELING MICROSCOPES; TEMPERATURE DEPENDENCE; TRANSIENT CURRENT;

TEMPERATURE DISTRIBUTION;

WIRE;

NANOWIRE;

ARTICLE; CHEMICAL STRUCTURE; ELECTRON TRANSPORT; MOLECULAR EVOLUTION; TEMPERATURE DEPENDENCE; THERMAL CONDUCTIVITY;

HYDROCARBONS, AROMATIC; MOLECULAR STRUCTURE; TEMPERATURE;

EID: 77955814620     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja1040946     Document Type: Article

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