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Volumn 42, Issue 15, 2013, Pages 5554-5565

CVD of pure copper films from novel iso-ureate complexes

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE X RAY SPECTROSCOPY; LOW PRESSURE CHEMICAL VAPOUR DEPOSITIONS; METAL PRECURSOR; METALLIC COPPER; POWDER X-RAY DIFFRACTION (PXRD); SINGLE CRYSTAL X-RAY DIFFRACTION ANALYSIS; SUBSTRATE TEMPERATURE; TEMPERATURE DEPENDENT;

EID: 84875449924     PISSN: 14779226     EISSN: 14779234     Source Type: Journal    
DOI: 10.1039/c3dt00104k     Document Type: Article
Times cited : (7)

References (89)
  • 65
    • 84875434191 scopus 로고
    • (M and T Chemicals Inc.), 1964-406571
    • A. G. Davies, (M and T Chemicals Inc.), Application: US 1964-406571, 1967
    • (1967) Application: US
    • Davies, A.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.