Misfit accommodation in oxide thin film heterostructures

Acta Materialia

Volumn 61, Issue 8, 2013, Pages 2725-2733

  Pennycook, S J ^a,b   Zhou, H ^c   Chisholm, M F ^a   Borisevich, A Y ^a   Varela, M ^a   Gazquez, J ^d   Pennycook, T J ^e   Narayan, J ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee   (United States)

^c North Carolina State University   (United States)

^d UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^e SUPERSTEM LABORATORY   (United Kingdom)

Author keywords

Defects; Dislocations; Misfit relaxation; Thin films

Indexed keywords

CONSTITUENT ELEMENTS; DIFFERENT MECHANISMS; ION CONDUCTING MATERIALS; MISFIT ACCOMMODATION; MISFIT RELAXATION; OCTAHEDRAL ROTATIONS; OXYGEN SUBLATTICES; STRUCTURAL COMPLEXITY;

COLOSSAL MAGNETORESISTANCE; DEFECTS; DISLOCATIONS (CRYSTALS); HETEROJUNCTIONS; OXYGEN; STOICHIOMETRY; THIN FILMS;

INTERFACES (MATERIALS);

EID: 84875442312     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.09.069     Document Type: Article

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