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Volumn 59, Issue 6, 2011, Pages 2526-2534
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Thin film epitaxy and magnetic properties of STO/TiN buffered ZnO on Si(0 0 1) substrates
a
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Author keywords
Crystal growth; Electron energy loss spectroscopy (EELS); Laser deposition; Magnetic thin films; Transmission electron microscopy (TEM)
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Indexed keywords
A-PLANE;
ATOMICALLY SHARP INTERFACE;
CUBIC SYMMETRY;
DEPOSITION TEMPERATURES;
ENERGY-LOSS SPECTROSCOPY;
EPITAXIAL RELATIONSHIPS;
FERROMAGNETIC ORDERS;
HIGH SUBSTRATE TEMPERATURE;
LASER DEPOSITION;
LOW OXYGEN PRESSURE;
ORIENTATION RELATIONSHIP;
OXYGEN PARTIAL PRESSURE;
PREFERENTIAL ORIENTATION;
SI(0 0 1);
SUBSTRATE TEMPERATURE;
THIN FILM EPITAXY;
ZNO;
ZNO FILMS;
ZNO ON SI;
BUFFER LAYERS;
CRYSTAL IMPURITIES;
CRYSTALLIZATION;
DEPOSITION;
ELECTRON ENERGY LEVELS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON MICROSCOPY;
ELECTRONS;
EPITAXIAL FILMS;
EPITAXIAL GROWTH;
EPITAXIAL LAYERS;
FERROMAGNETIC MATERIALS;
FERROMAGNETISM;
MAGNETIC DEVICES;
MAGNETIC PROPERTIES;
MAGNETIC THIN FILMS;
OPTICAL WAVEGUIDES;
OXYGEN;
SEMICONDUCTING SILICON COMPOUNDS;
SUBSTRATES;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
ZINC OXIDE;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 79951683273
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.12.058 Document Type: Article |
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Times cited : (15)
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References (31)
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