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Volumn 97, Issue 15, 2010, Pages

Near bulk semiconductor to metal transition in epitaxial VO2 thin films

Author keywords

[No Author keywords available]

Indexed keywords

BULK SEMICONDUCTORS; C-PLANE SAPPHIRE SUBSTRATES; C-SAPPHIRE; DOMAIN MATCHING EPITAXY; ELECTRICAL RESISTANCES; GAUSSIAN FITS; HETEROSTRUCTURES; IN-PLANE ORIENTATION; IN-SITU; INTEGRAL MULTIPLES; MISFIT STRAINS; ORIENTATION RELATIONSHIP; POLE FIGURE; PULSED-LASER DEPOSITION TECHNIQUE; SEMICONDUCTOR-TO-METAL TRANSITIONS; STRUCTURAL CHARACTERIZATION; TEMPERATURE DEPENDENCE; TEMPERATURE VALUES; TRANSITION WIDTHS;

EID: 77958106375     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3503632     Document Type: Article
Times cited : (59)

References (13)
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  • 6
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    • 2 (001) and (110) substrates
    • DOI 10.1063/1.1446215
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.