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Applied Physics Letters

Volumn 82, Issue 20, 2003, Pages 3427-3429

Impact of stress on oxygen vacancy ordering in epitaxial (La0.5Sr0.5)CoO3-∂ thin films

(4) Klenov, Dmitri O a Donner, Wolfgang b Foran, Brendan c Stemmer, Susanne a

a University of California (United States)

b University of Houston (United States)

c SEMATECH (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; LANTHANUM COMPOUNDS; OXYGEN; PARTIAL PRESSURE; SPUTTER DEPOSITION; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

THIN FILMS;

EID: 0038657961 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1575503 Document Type: Article

Times cited : (88)

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