Lorentz-force-induced excitation of cantilevers for oscillation-mode scanning probe microscopy

Surface and Interface Analysis

Volumn 36, Issue 2, 2004, Pages 119-123

  Enders, O ^a   Korte, F ^b   Kolb, H A ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

A.C. mode; Lorentz force; Scanning probe microscope

Indexed keywords

DYNAMICS; LASER APPLICATIONS; MAGNETIC FIELD EFFECTS; MECHANICAL PROPERTIES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; REFLECTIVE COATINGS; THERMAL EFFECTS;

BIMETAL PROPERTIES; LORENTZ-FORCE-INDUCED EXCITATION; OSCILLATION-MODE SCANNING PROBE MICROSCOPY; THERMAL EXCITATION;

SURFACE CHEMISTRY;

EID: 1642385943     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1665     Document Type: Article

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