Wideband low-noise optical beam deflection sensor with photothermal excitation for liquid-environment atomic force microscopy

Review of Scientific Instruments

Volumn 80, Issue 2, 2009, Pages

  Fukuma, Takeshi ^a,b  

^a KANAZAWA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; BANDWIDTH; DEFLECTION (STRUCTURES); LIQUIDS; MICA; NANOCANTILEVERS; OPTICAL MICROSCOPY; SILICATE MINERALS; TELECOMMUNICATION SYSTEMS;

ATOMIC FORCES; ATOMIC-RESOLUTION IMAGES; ATOMIC-RESOLUTION IMAGING; CANTILEVER EXCITATIONS; DEFLECTION SENSORS; EXCITATION SYSTEMS; FOCUS LENS; LOW NOISE; NOISE DENSITIES; NOISE LEVELS; NOISE PERFORMANCE; OPTICAL BEAM DEFLECTIONS; PHASE VERSUS FREQUENCIES; PHOTO THERMALS; PHOTOTHERMAL EXCITATIONS; WIDE BANDS; WIDE BANDWIDTHS;

SENSORS;

EID: 61449201929     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3086418     Document Type: Article

References (29)

1. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.56.930 56, 930 (1986).
2. T. R. Albrecht, P. Grütter, D. Horne, and D. Ruger, J. Appl. Phys. 0021-8979 10.1063/1.347347 69, 668 (1991).
3. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 0021-8979 10.1063/1.338807 61, 4723 (1987).
4. G. M. McClelland, R. Erlandsson, and S. Chiang, Review of Progress in Quantitative Non-Destructive Evaluation (Plenum, New York, 1988), Vol. 6B, pp. 1307-1314.
5. G. Meyer and N. M. Am, Appl. Phys. Lett. 0003-6951 10.1063/1.100061 53, 1045 (1988).
6. C. Schönenberger and S. F. Alvarado, Rev. Sci. Instrum. 0034-6748 10.1063/1.1140543 60, 3131 (1989).
7. G. Neubauer, S. R. Cohen, G. M. McClelland, D. Horne, and C. M. Mate, Rev. Sci. Instrum. 0034-6748 10.1063/1.1141354 61, 2296 (1990).
8. M. Tortonese, H. Yamada, R. C. Barrett, and C. F. Quate, The Proceedings of Transducers, 1991, Publication No. 91 CH2817-5 (IEEE, Pennington, NJ, 1991), pp. 448-451.
9. T. Itoh and T. Suga, Nanotechnology 0957-4484 10.1088/0957-4484/4/4/007 4, 218 (1993).
10. F. J. Giessibl, Noncontact Atomic Force Microscopy (Nanoscience and Technology) (Springer, Berlin, 2002), Chap..
11. T. Fukuma, M. Kimura, K. Kobayashi, K. Matsushige, and H. Yamada, Rev. Sci. Instrum. 0034-6748 10.1063/1.1896938 76, 053704 (2005).
12. T. Fukuma, K. Kobayashi, K. Matsushige, and H. Yamada, Appl. Phys. Lett. 0003-6951 10.1063/1.1999856 87, 034101 (2005).
13. T. Fukuma and S. P. Jarvis, Rev. Sci. Instrum. 0034-6748 10.1063/1.2188867 77, 043701 (2006).
14. T. Fukuma, M. J. Higgins, and S. P. Jarvis, Biophys. J. 0006-3495 10.1529/biophysj.106.100651 92, 3603 (2007).
15. T. Fukuma, M. J. Higgins, and S. P. Jarvis, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.98.106101 98, 106101 (2007).
16. T. Fukuma, A. S. Mostaert, and S. P. Jarvis, Nanotechnology 19, 384010 (2008). 0957-4484
17. M. Reinstädtler, T. Kasai, U. Rabe, B. Bhushan, and W. Arnold, J. Phys. D 0022-3727 10.1088/0022-3727/38/18/R01 38, R269 (2005).
18. N. F. Martinez, S. Patil, J. R. Lozano, and R. Garcia, Appl. Phys. Lett. 0003-6951 10.1063/1.2360894 89, 153115 (2006).
19. S. Kawai, S. Kitamura, D. Kobayashi, S. Meguro, and H. Kawakatsu, Appl. Phys. Lett. 0003-6951 10.1063/1.1923200 86, 193107 (2005).
20. A. Raman, J. Melcher, and R. Tung, Nanotoday 3, 20 (2008). 0003-6951
21. S. Hembacher, F. J. Giessibl, and J. Mannhart, Science 0036-8075 10.1126/science.1099730 305, 380 (2004).
22. J. Preiner, J. Tang, V. Pastushenko, and P. Hinterdorfer, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.99.046102 99, 046102 (2007).
23. F. J. Giessibl, H. Bielefeldt, S. Hembacher, and J. Mannhart, Appl. Surf. Sci. 0169-4332 10.1016/S0169-4332(98)00553-4 140, 352 (1999).
24. F. J. Giessibl, S. Hembacher, H. Bielefeldt, and J. Mannhart, Science 0036-8075 10.1126/science.289.5478.422 289, 422 (2000).
25. S. P. Jarvis, A. Oral, T. P. Weihs, and J. B. Pethica, Rev. Sci. Instrum. 0034-6748 10.1063/1.1144276 64, 3515 (1993).
26. I. Revenko and R. Proksch, J. Appl. Phys. 0021-8979 10.1063/1.371894 87, 526 (2000).
27. B. Rogers, D. York, N. Whisman, M. Jones, K. Murray, and J. D. Adams, Rev. Sci. Instrum. 0034-6748 10.1063/1.1499532 73, 3242 (2002).
28. N. Umeda, S. Ishizaki, and H. Uwai, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.585187 9, 1318 (1991).
29. D. Ramos, J. Tamayo, J. Mertens, and M. Calleja, Appl. Phys. Lett. 99, 124904 (2006). 0003-6951