Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid

Review of Scientific Instruments

Volumn 79, Issue 12, 2008, Pages

  Nishida, Shuhei ^a   Kobayashi, Dai ^a   Sakurada, Takeo ^a   Nakazawa, Tomonori ^a   Hoshi, Yasuo ^a   Kawakatsu, Hideki ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; BOND STRENGTH (CHEMICAL); CHEMICAL BONDS; CLASSIFIERS; DOPPLER EFFECT; LASER DOPPLER VELOCIMETERS; LASER EXCITATION; MICA; NANOCANTILEVERS; SILICATE MINERALS; VELOCIMETERS; VELOCITY MEASUREMENT; VIBRATING CONVEYORS;

ATOMIC RESOLUTIONS; CANTILEVER VIBRATIONS; DOPPLER VELOCIMETRY; DYNAMIC ATOMIC FORCE MICROSCOPIES; FLEXURAL MODES; FORCE GRADIENTS; FREQUENCY SPECTRUMS; HIGHER MODES; INDIVIDUAL ATOMS; MICA SURFACES; OSCILLATION AMPLITUDES; PHOTOTHERMAL EXCITATIONS; RESOLUTION IMAGING; SILICON CANTILEVERS; SPURIOUS RESONANCES; TIP AMPLITUDES;

ATOMIC PHYSICS;

EID: 58149252793     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3040500     Document Type: Article

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