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Journal of Polymer Science, Part B: Polymer Physics

Volumn 51, Issue 7, 2013, Pages 611-620

Vertical confinement and interface effects on the microstructure and charge transport of P3HT thin films

(6) Jimison, Leslie H a,c Himmelberger, Scott a Duong, Duc T a Rivnay, Jonathan a,c Toney, Michael F b Salleo, Alberto a

a Stanford University (United States)

b SLAC NATIONAL ACCELERATOR LABORATORY (United States)

c ECOLE DES MINES DE SAINT ETIENNE (France)

Author keywords

charge transport; crystallization; structure property relations; thin films; X ray

Indexed keywords

CRYSTALLINITIES; FIELD-EFFECT DEVICES; INTERFACE EFFECT; NUCLEATING AGENTS; POLE FIGURE; POLY (3-HEXYLTHIOPHENE); SAMS; SEMICONDUCTOR-DIELECTRIC INTERFACE; STRUCTURE PROPERTY RELATION; TRANSPORT MEASUREMENTS;

CARRIER MOBILITY; CHARGE TRANSFER; CRYSTALLIZATION; MICROSTRUCTURE; SELF ASSEMBLED MONOLAYERS; THIN FILMS; X RAY DIFFRACTION; X RAYS;

INTERFACES (MATERIALS);

EID: 84874456526 PISSN: 08876266 EISSN: 10990488 Source Type: Journal
DOI: 10.1002/polb.23265 Document Type: Article

Times cited : (88)

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