Depth-resolved molecular structure and orientation of polymer thin films by synchrotron X-ray diffraction

European Polymer Journal

Volumn 47, Issue 3, 2011, Pages 273-283

  Porzio, W ^a   Scavia, G ^a   Barba, L ^b   Arrighetti, G ^b   Milita, S ^a  

^a CNR   (Italy)

^b CNR   (Italy)

Author keywords

Polymer science; Structure and orientation; Surface interactions; Synchrotron radiation

Indexed keywords

BURIED INTERFACE; DEPTH-RESOLVED; FUNCTIONALIZED; GRAZING INCIDENCE; HIGHER ORDER; IN-PLANE; INCIDENT ANGLES; MACRO-MOLECULAR LAYERS; OUT-OF-PLANE; POLY (3-HEXYLTHIOPHENE); POLYMER SCIENCE; POLYMER THIN FILMS; SI WAFER; SILICON SUBSTRATES; SPIN CASTING; STRUCTURAL INFORMATION; STRUCTURE AND ORIENTATION; SUBSTRATE SURFACE; SURFACE INTERACTIONS; SYNCHROTRON X RAY DIFFRACTION;

CRYSTALLITE SIZE; DIFFRACTION; MOLECULAR ORIENTATION; PLASTIC FILMS; POLYMER FILMS; POLYMERIC FILMS; POLYMERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SUBSTRATES; SYNCHROTRON RADIATION; SYNCHROTRONS; THIN FILMS; X RAY DIFFRACTION;

SURFACE STRUCTURE;

EID: 79951810740     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2010.12.007     Document Type: Article

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