X-ray structural and crystallinity studies of low and high molecular weight poly(3-hexylthiophene)

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 3, 2008, Pages 488-496

  Joshi, S ^a   Grigorian, S ^a   Pietsch, U ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS; BEST MATCHES; CONTINUOUS; CRYSTALLINITY; FILM MORPHOLOGIES; MOLECULAR WEIGHT FRACTIONS; MONOCLINIC UNIT CELLS; NANOSCALE MORPHOLOGIES; PHASE-TRANSITION; PREFERENTIAL ORIENTATIONS; RANDOM ORIENTATIONS; RAY ANALYSES; RAY GRAZINGS; STRUCTURAL INFORMATIONS; SUBSTRATE INTERACTIONS; SURFACE NORMALS; THICKNESS DEPENDENCES; THICKNESS OF FILMS; X-RAY DIFFRACTIONS;

CARRIER MOBILITY; DIFFRACTION; DROPS; ELECTROMAGNETIC WAVES; ELECTRONIC PROPERTIES; MAGNETIC FILMS; MELTING POINT; MOLECULAR BEAM EPITAXY; MOLECULAR ORIENTATION; MOLECULAR WEIGHT; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLITES; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; STRONTIUM COMPOUNDS; SYNCHROTRON RADIATION; THERMOCHEMISTRY; THICK FILMS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

AMORPHOUS FILMS;

EID: 54849430417     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200723423     Document Type: Article

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