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Volumn 85, Issue 4, 2013, Pages 2348-2355

Dynamics displayed by energetic C60 bombardment of metal overlayers on an organic substrate

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER BOMBARDMENT; FORMATION OF HOLE; INFORMATION DEPTH; METAL ATOMS; METAL OVERLAYERS; METAL-ORGANIC INTERFACE; MOLECULAR DYNAMICS COMPUTER SIMULATIONS; ORGANIC MOLECULES; ORGANIC SOLIDS; ORGANIC SUBSTRATE;

EID: 84874038108     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac303348y     Document Type: Article
Times cited : (3)

References (63)
  • 4
    • 84874099327 scopus 로고    scopus 로고
    • In, 2 nd ed. Vickerman, J. C. Briggs, D. IM Publications: Chichester, U.K
    • Niehuis, E. In ToF-SIMS: Surface Analysis by Mass Spectrometry, 2 nd ed.; Vickerman, J. C.; Briggs, D., Eds.; IM Publications: Chichester, U.K., 2012.
    • (2012) ToF-SIMS: Surface Analysis by Mass Spectrometry
    • Niehuis, E.1
  • 30
    • 27144498463 scopus 로고
    • CrystalMaker Software Ltd. Oxford, England
    • CrystalMaker; CrystalMaker Software Ltd.: Oxford, England, 1994; www.crystalmaker.com.
    • (1994) CrystalMaker


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.