Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples

Surface and Interface Analysis

Volumn 40, Issue 3-4, 2008, Pages 538-542

  Heile, A ^a   Lipinsky, D ^a   Wehbe, N ^b   Delcorte, A ^b   Bertrand, P ^b   Felten, A ^c   Houssiau, L ^c   Pireaux, J J ^c   De Mondt, R ^d   Van Royen, P ^d   Van Vaeck, L ^d   Arlinghaus, H F ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c UNIVERSITY OF NAMUR   (Belgium)

^d UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Cluster bombardment; MetA SIMS; Polyatomic projectiles; Polymers; TOF SIMS

Indexed keywords

GOLD; ION BOMBARDMENT; METALLIZING; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY;

CHEMICAL ENVIRONMENTS; CLUSTER BOMBARDMENT; MINIATURIZATION; POLYATOMIC PROJECTILES;

ORGANIC POLYMERS;

EID: 42449121338     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2810     Document Type: Conference Paper

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