SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 1030-1034

Mechanisms of metal-assisted secondary ion mass spectrometry: A mixed theoretical and experimental study

(7) Restrepo, O a Prabhakaran, A a Hamraoui, K a Wehbe, N a Yunus, S a Bertrand, P a Delcorte, A a

a UNIVERSITÉ CATHOLIQUE DE LOUVAIN (Belgium)

Author keywords

C60; Matrix effects; Molecular dynamics; Nanoparticle; Polymer; SIMS

Indexed keywords

C60; EXPERIMENTAL STUDIES; IMPACT POINT; ION YIELDS; MATRIX EFFECTS; METAL-ORGANIC; MOLECULAR DYNAMICS SIMULATIONS; ORGANIC MATERIALS; POLYMER SAMPLES; SPUTTERING YIELDS; YIELD ENHANCEMENT;

DYNAMICS; IONS; METALS; MOLECULAR DYNAMICS; NANOPARTICLES; ORGANIC POLYMERS; POLYMERS; PROJECTILES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SPUTTERING; SURFACES;

EXPERIMENTS;

EID: 77954297710 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3203 Document Type: Conference Paper

Times cited : (18)

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