Surface sputtering with nanoclusters: The relevant parameters

Surface and Interface Analysis

Volumn 45, Issue 1, 2013, Pages 9-13

  Delcorte, A ^a   Restrepo, O A ^a   Czerwinski, B ^a   Garrison, B J ^b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

cluster SIMS; crosslinking; desorption; molecular depth profiling; molecular dynamics; nanoclusters

Indexed keywords

CLUSTER ENERGY; CLUSTER ION BEAMS; CLUSTER PROJECTILES; CLUSTER SIMS; MOLECULAR DEPTH PROFILING; MOLECULAR DYNAMICS SIMULATIONS; ORGANIC SOLIDS; ORGANIC SURFACES; PHYSICAL PARAMETERS; PHYSICAL QUANTITIES; SPUTTERING YIELDS; SURFACE SPUTTERING;

CROSSLINKING; DESORPTION; MOLECULAR DYNAMICS;

NANOCLUSTERS;

EID: 84872831707     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4926     Document Type: Conference Paper

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