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Volumn 43, Issue 1-2, 2011, Pages 116-119

The effect of the H:C ratio on the sputtering of molecular solids by fullerenes

Author keywords

Fullerene Impacts; Molecular Dynamics Simulation; Molecular Solids; SIMS; Sputtering

Indexed keywords

CLUSTER SIMS; DEPTH PROFILE; FULLERENE MOLECULES; FULLERITES; HYDROGEN CONTENTS; IMPACT CRATERS; MOLECULAR DYNAMICS SIMULATIONS; MOLECULAR MATERIALS; MOLECULAR SOLID; MOLECULAR SYSTEMS; REACTION ZONES; SIMS;

EID: 78951476284     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3421     Document Type: Conference Paper
Times cited : (10)

References (8)
  • 6
    • 0004123702 scopus 로고    scopus 로고
    • in (Eds: J. C. Vickerman, D. Briggs), IM Publications and SurfaceSpectra Ltd: London
    • B. J. Garrison, in ToF-SIMS: Surface Analysis by Mass Spectrometry, (Eds:, J. C. Vickerman, D Briggs,), IM Publications and SurfaceSpectra Ltd: London, 2001, 223.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 223
    • Garrison, B.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.