Assignment of capacitance spectroscopy signals of CIGS solar cells to effects of non-ohmic contacts

Solar Energy Materials and Solar Cells

Volumn 112, Issue , 2013, Pages 78-83

  Lauwaert, Johan ^a   Van Puyvelde, Lisanne ^a   Lauwaert, Jeroen ^a   Thybaut, Joris W ^a   Khelifi, Samira ^a   Burgelman, Marc ^a   Pianezzi, Fabian ^b   Tiwari, Ayodhya N ^b   Vrielinck, Henk ^a  

^a GHENT UNIVERSITY   (Belgium)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Capacitance spectroscopy; CIGS solar cells

Indexed keywords

ABSORBER LAYERS; BACK CONTACT; CAPACITANCE SPECTROSCOPY; CAPACITANCE TRANSIENT; CIGS SOLAR CELLS; DIRECT MEASUREMENT; ELECTRICAL MODELS; EXPERIMENTAL OBSERVATION; FUNCTION OF TIME; NON-OHMIC CONTACTS; P-N JUNCTION; PRACTICAL USE; ROOM TEMPERATURE; THIN-FILM PHOTOVOLTAIC CELLS; TIME CONSTANTS; TO EFFECT; VOLTAGE TRANSIENTS;

DIFFERENTIAL EQUATIONS; ELECTRIC CONTACTORS; OHMIC CONTACTS; PHOTOVOLTAIC CELLS; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS; TRANSIENTS;

CAPACITANCE;

EID: 84873623112     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.01.014     Document Type: Article

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