Signature of a back contact barrier in DLTS spectra

Journal of Applied Physics

Volumn 109, Issue 6, 2011, Pages

  Lauwaert, J ^a   Khelifi, S ^a   Decock, K ^a   Burgelman, M ^a   Vrielinck, H ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BACK CONTACT; CAPACITANCE TRANSIENT; DEFECT LEVELS; DLTS; DLTS SPECTRA; JUNCTION DIODE; NEGATIVE CAPACITANCE; NONIDEAL; VOLTAGE PULSE;

CAPACITANCE; DEEP LEVEL TRANSIENT SPECTROSCOPY; DIODES; ELECTRIC POTENTIAL; GERMANIUM; TUNNEL DIODES;

POWER QUALITY;

EID: 79953663693     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3564938     Document Type: Article

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