Hopping conduction observed in thermal admittance spectroscopy

Physical Review Letters

Volumn 104, Issue 22, 2010, Pages

  Reislohner U ^a   Metzner, H ^a   Ronning, C ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER HOPPING; CU(IN ,GA)(SE ,S)2; HOPPING CONDUCTION; MINORITY CARRIER; NEW APPROACHES; THERMAL ADMITTANCE SPECTROSCOPY; THIN-FILM SOLAR CELLS; TRAP PARAMETERS; VARIABLE-RANGE HOPPING CONDUCTION;

COPPER; ELECTRIC ADMITTANCE; SEMICONDUCTING SELENIUM COMPOUNDS;

CARRIER MOBILITY;

EID: 77953102406     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.226403     Document Type: Article

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