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Volumn 93, Issue 8, 2009, Pages 1290-1295

Understanding defect-related issues limiting efficiency of CIGS solar cells

Author keywords

Capacitance; CIGS; Defects; Device modelling

Indexed keywords

CIGS; CIGS SOLAR CELLS; CU(IN , GA)SE; DEFECT MODEL; DEVICE MODELLING; ELECTRICAL CHARACTERISTIC; NEGATIVE-U; NUMERICAL SIMULATION; PHOTOCARRIER; PHOTOVOLTAIC PARAMETERS; RECOMBINATION MECHANISMS;

EID: 67349160738     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.01.022     Document Type: Article
Times cited : (118)

References (23)
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  • 7
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    • Metastabilities in the electrical characteristics of CIGS devices - experimental results vs theoretical predictions
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    • Igalson, M.1    Cwil, M.2    Edoff, M.3
  • 9
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    • Anion vacancies as a source of persistent photoconductivity in II-VI and chalcopyrite semiconductors
    • (pp. 1-13)
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    • Lany, S.1    Zunger, A.2
  • 10
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    • Cu) vacancy complex
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  • 14
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    • Modelling polycrystalline semiconductor solar cells
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    • P. Zabierowski, C. Plätzer-Bjorkman, Influence of metastabilities on the efficiency of CIGSe-based solar cells with Zn(O,S) and (Zn,Mg)O buffer, in: Proceedings of the 22nd European Photovoltaic Solar Energy Conference, Milan 2007, pp. 2395-2401.
    • P. Zabierowski, C. Plätzer-Bjorkman, Influence of metastabilities on the efficiency of CIGSe-based solar cells with Zn(O,S) and (Zn,Mg)O buffer, in: Proceedings of the 22nd European Photovoltaic Solar Energy Conference, Milan 2007, pp. 2395-2401.
  • 18
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    • The influence of buffer layer on the transient behavior of thin film chalcopyrite devices
    • Igalson M., and Platzer-Björkman C. The influence of buffer layer on the transient behavior of thin film chalcopyrite devices. Sol. Energy. Mater. Sol. Cells 84 (2004) 93-103
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  • 20
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    • M. Igalson, Metastable defect distributions in CIGS solar cells and their impact on device efficiency, in: Mater. Res. Soc. Symp. Proc., 1012, pp. 1012-Y04-01.
    • M. Igalson, Metastable defect distributions in CIGS solar cells and their impact on device efficiency, in: Mater. Res. Soc. Symp. Proc., vol. 1012, pp. 1012-Y04-01.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.