A method for producing site-specific tem specimens from low contrast materials with nanometer precision

Microscopy and Microanalysis

Volumn 19, Issue 1, 2013, Pages 73-78

  Pettersson, Henrik ^a   Nik, Samira ^a   Weidow, Jonathan ^a   Olsson, Eva ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

focused ion beam; Key words specimen preparation; lift out; low contrast materials; scanning electron microscopy; site specific; transmission electron microscopy

Indexed keywords

EID: 84873357506     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612013311     Document Type: Article

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