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Volumn 126, Issue , 2008, Pages
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Site-specific, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 65649095594
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/126/1/012097 Document Type: Article |
Times cited : (2)
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References (11)
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