Advances in TEM sample preparation using a focused ion beam

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 380-381

  Van Leer, Brandon ^a   Giannuzzi, Lucille A ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549106217     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608086030     Document Type: Conference Paper

References (4)

1. S.J. Klepeis et al., "A Grinding/Polishing Tool for SEM Sample Preparation." In Specimen Preparation for Transmission Electron Microscopy of Materials, Mater. Res. Soc. Proc. 115 1987.
2. D. Wall, "Ultra-Fast In-Situ S/TEM Sample Preparation." FEI Company Application Note P/N 04AP-FR0111, FEI Company, 2007.
3. B. Van Leer et al., "Applications of Focused Ion Beam and DualBeam for Nanofabrication." Scanning Microscopy for Nanotechnology: Techniques and Applications, Springer, New York, 2007
4. L. A. Giannuzzi et al., Micros. Microanal., 11(Suppl 2) (2005) 828.