FALCON: Rapid statistical fault coverage estimation for complex designs

Proceedings - International Test Conference

Volumn , Issue , 2012, Pages

  Mirkhani, Shahrzad ^a   Abraham, Jacob A ^a   Vo, Toai ^b   Jun, Hongshin ^b   Eklow, Bill ^b  

^a The University of Texas at Austin   (United States)

^b CISCO SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCIAL TOOLS; COMPLEX DESIGNS; DESIGN UNDER TESTS; ERROR RATE; FAULT COVERAGES; FAULT GRADING; FAULT SIMULATION; LARGE DESIGNS; LARGE SYSTEM; LOCAL FAULTS; MODULAR DESIGNS; NUMBER OF GATES; RUNTIMES; SCALABLE METHODS;

ESTIMATION; SCALABILITY;

DESIGN;

EID: 84873203380     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2012.6401584     Document Type: Conference Paper

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