A statistical model for fault coverage analysis

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1991, Pages 227-232

  Chen, Chung Ho ^a   Soong, N L ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b VILLANOVA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DETECTION; VLSI CIRCUITS;

DEFECT LEVELS; EVALUATION OF TEST; FAULT COVERAGES; MODEL PARAMETERS; PRODUCTION TEST; STATISTICAL MODELING; STUCK-AT FAULTS; TEST FREQUENCIES;

TESTING;

EID: 84873209441     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.1991.208163     Document Type: Conference Paper

References (10)

1. T.W. Williams, "Test Length in a Self- Testing Environment", IEEE Design and Test of Computers. April, 1985
2. S.K. Jain, Y.D. Agrawal, "Statistical Fault Analysis", IEEE Design and Test of Computers. February, 1985
3. W.K. Huang, M. Lightner, F. Lombardi, "Predicting Fault Coverage for Random Testing of Combinational Circuits", International Test Conference. October, 1987
4. S.K. Jain, V.D. Agrawal, "STAFAN: An Alternative to Fault Simulation", 21st. Design Automation Conference. 1984
5. J. Savir, G.S. Ditlow, P. Bardell, "Random Pattern Testability", IEEE Transaction on Computers. Vol. C-33, No.l, January, 1984
6. K.P. Parker, E.J. McClusky, "Probabilistic Treatment of General Combinational Networks", IEEE Transaction on Computers. Vol. C-24, No.6, June, 1975
7. V.D. Agrawal, "Sampling Techniques for Determining Fault Coverage in LSI Circuits", Journal of Digital Systems. Vol. V, 1981
8. P. Goel, "Test Generation Costs Analysis and Projections", 17th. Design Automation Conference. June, 1980
9. A. Susskind, "Testability Measures", Design for Testability Workshop. Boulder, Colorado, 1980
10. N.L. Soong, "The Measurement and Management of Risk in Software Quality Control", Research Report. Department of Mathematical Sciences, Villanova University, Villanova, Pennsylvania, 1989