Pentium Pro processor design for test and debug

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 294-303

  Carbine, Adrian ^a   Feltham, Derek ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; MICROPROCESSOR CHIPS; QUALITY ASSURANCE; SEMICONDUCTING SILICON;

DESIGN FOR TESTABILITY (DFT);

INTEGRATED CIRCUIT TESTING;

EID: 0031380354     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)